Texture analysis by time-of-flight neutron diffraction, carried out on a multidetector instrument, requires just a few sample orientations. Moreover, on a diffractometer like GEM at ISIS with sufficiently high detector coverage a quantitative bulk texture analysis can be performed even on a stationary sample in a matter of minutes. A 'single-shot', rapid texture measurement on a high-count-rate instrument can be of considerable benefit for studying materials at non-ambient conditions or for bulky samples that cannot be mounted on a goniometer. The capabilities of GEM for texture analysis are demonstrated with results on copper texture standards, which were studied to accompany diffraction analyses of archaeological objects. © 2006 Elsevier B.V. All rights reserved.
Materials by design for sustainable solutions in the energy, medical, transport, and engineering sectors
