Sources and Mechanism of Degradation in p‑Type Thiophene-Based Organic Electrochemical Transistors

Schafer EA, Wu R, Meli D, Tropp J, Moser M, McCulloch I, Paulsen BD, Rivnay J
26 April 2022
Journal article
Journal:
ACS Applied Electronic Materials
Volume:
4
Issue:
4
,
American Chemical Society (ACS)
,
pp.
1391 - 1404
No abstract available
Keywords:

40 Engineering

,

4016 Materials Engineering

,

34 Chemical Sciences

DOI
10.1021/acsaelm.1c01171