Lead diffusion in CaTiO3: A combined study using Rutherford backscattering and TOF-SIMS for depth profiling to reveal the role of lattice strain in diffusion processes

Beyer C, Dohmen R, Rogalla D, Becker H-W, Marquardt K, Vollmer C, Hagemann U, Hartmann N, Chakraborty S
No abstract available
Keywords:

37 Earth Sciences

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3706 Geophysics