Probing the critical electronic properties of III—V nanowires using optical pump-terahertz probe spectroscopy

Joyce HJ, Docherty CJ, Yong C-K, Wong-Leung J, Gao Q, Paiman S, Tan HH, Jagadish C, Lloyd-Hughes J, Herz LM, Johnston MB
1 September 2013
Journal article
Institute of Electrical and Electronics Engineers (IEEE)
,
pp.
1 - 2
No abstract available
Keywords:

51 Physical Sciences

,

40 Engineering

,

4018 Nanotechnology

DOI
10.1109/irmmw-thz.2013.6665866