Revealing buried interfaces to understand the origins of threshold voltage shifts in organic field-effect transistors.

Mathijssen SGJ, Spijkman M-J, Andringa A-M, van Hal PA, McCulloch I, Kemerink M, Janssen RAJ, de Leeuw DM
December 2010
Journal article
Journal:
Advanced materials (Deerfield Beach, Fla.)
Volume:
22
Issue:
45
,
pp.
5105 - 5109
No abstract available
Keywords:

Microscopy, Scanning Probe

,

Transistors, Electronic

,

Photoelectron Spectroscopy

DOI
10.1002/adma.201001865