Investigation of Parasitic Edge Recombination in High-Lifetime Oxidized n-Si

Bonilla RS, Martins G, Wilshaw PR
9 February 2016
Conference paper
Journal:
Solid State Phenomena
Volume:
242
,
Trans Tech Publications
,
pp.
73 - 79
No abstract available
Keywords:

40 Engineering

,

4018 Nanotechnology

,

Biotechnology

DOI
10.4028/www.scientific.net/ssp.242.73